IEEE Std 1149.6-2015 IEEE Standard for Boundary-Scan Testing of Advanced Digita（原版完整文件）VIP免费

IEEE STANDARDS ASSOCIATION◆IEEEIEEE Standard for Boundary-ScanTesting of Advanced Digital NetworksIEEE Computer SocietySponsored by theTest Technology Standards CommitteeIEEE3 Park AvenueNew York,NY 10016-5997USAIEEE Std 1149.6M-2015(Revision ofIEEE Std 1149.6-2003)Authorized licensed use limited to:University of Waterloo.Downloaded on April 08,2016 at 01:21:00 UTC from IEEE Xplore.Restrictions apply.Authorized licensed use limited to:University of Waterloo.Downloaded on April 08,2016 at 01:21:00 UTC from IEEE Xplore.Restrictions applyIEEE Std 1149.6TM-2015(Revision of IEEE Std 1149.6-2003)IEEE Standard for Boundary-ScanTesting of Advanced Digital NetworksSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 5 December 2015IEEE-SA Standards BoardAuthorized licensed use limited to:University of Waterloo.Downloaded on April 08,2016 at 01:21:00 UTC from IEEE Xplore.Restrictions apply.Abstract: IEEE Std 1149.1TM is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.Keywords: ac-coupled signaling, boundary scan,circuit boards,differential signaling, IEEE 1149.6TM,integrated circuits,interconnect test,printed circuit boards,testThis standard is dedicated to the memoryof our friend and colleague,Carl Barnhart.This was Carl's standard from start tofinish.Carl was our leader and mentor.The Institute of Electrical and Electronics Engineers,Inc.3 Park Avenue,New York,NY 10016-5997,USACopyright 2016 by The Institute of Electrical and Electronics Engineers,Inc.All nights reserved.Published 18 March 2016.Printed in the United States of America.IEEE is a registered trademark in the U.S.Patent &Trademark Office,owned by The Institute of Elect...