射线萤光光谱仪检验规范标准

機密等級:機密USI Controlled DocumentConfidential Level: ConfidentialDocument Title(文件名稱) :X-Ray fluorescence test specification(X 射線螢光光譜儀(XRF)檢驗規範)Document Number(文件編號):AT-0801-M427Revision(文件版本):A6Revise Date:6/26/2009Prepared by(撰寫者):Edwin Huang 黃基泉Create by which Unit(制定單位) :CQM/GRM/GDAG-0801-M006-F2 Rev.:A1Amendment RecordsItem:Date:Revision: Page:Change Description:Changed by:103/31/2005 A26,71.Delete the Cr from the item of XRF test.2.Add remark.Eric Chang204/10/2006 A371.Add remark 3Eric Chang304/10/2006 A36包裝材料的測試值修改為: 鉛+汞+鎘+铬需小於 100ppm,其中需鎘小於 5ppmEric Chang405/05/2006 A1AllCoding change from TT-0801-Q095 to TT-0801-M401Eric Chang505/05/2006 A16,71. 修改附件一 XRF 測試零件及產品類別之有害物質限值表規格之 Pb, Cr, Hg: 700ppm，增加 Cd:60ppm 之管制2. 刪除 Remark 對 Cr 暫不設定管制上限之規定Eric Chang607/05/2006A1All1. Document coding change from TT-0801-M401-A1 to AT-0801-M427-A1.2. Add the purpose and scope.Ken Ke柯炤榕711/30/2006A22,4,111. Omit that this program is practicable in Taiwan and China sites.2. Modify Method 3: test point of PCB.3. Remove Package item on attachment 1: the Cd must under 5 ppm.Edwin Huang804/29/2008A310,121. Add halogen free and Spot test items.2. Delete Br controlling item.Edwin Huang908/20/2008A41,10,12~141. Add attention items for the tool management process of mechanical preparation.2. Add the flow chart and form for the management process to attachment.Edwin Huang1009/04/2008A510~12Updated Attachment 1: EHS threshold value of component type for XRF testEdwin Huang1106/26/2009A6101112141. Add test method if customer request2. Delete” IQC won’t control the threshold value of Cl..3. Add “If the material composed of metal, glass and ceramic. The component won’t be carried out halogen...