一种冲击实验的装置论文摘 要微电子产品在使用和运输过程中都可能因为不同形式的冲击而造成功能失效，因此微电子产品的抗冲击能力成为电子产品可靠性的一个重要评价指标，也是结构设计的一个重要考虑因素。但是目前常用的冲击试验机都是针对结构尺寸较大，质量较重的产品，对于微电子产品这种结构小、重量轻的特点，一般的试验机不能有效地检测出其冲击的力学特性。本论文首先研究了不同试验机的方案，分析其工作原理，并加以借鉴，从中得到了实现测试微电子产品抗冲击的理论的启发，在理论上设计出微电子跌落试验机的基本结构，这对检测微电子产品的抗冲击能力有着重要的意义。关键词：微电子产品；跌落式；试验机；抗冲击；工作原理AbstractPortable electronic devices are well known to be susceptible to drop impact which can cause various damage modes such as interconnect breakage ， battery separation in cellular phones，possible cracking along inter— faces．Drop impact performance of these products is one of important concerns of product design ． Because of the small size of this type of electronic products ， it is very expensive，time—consuming and difficult to conduct drop tests to directly detect the failure mechanisms and identify their drop behaviors．The main content of this paper lists the different programs of the testing machine and analyze the work theory, and reference it ,Which has been inspired by the theory of testing microelectronic products impact,and design the basic structure of microelectronics products Drop Test Machine in theory, It is important for the anti-wrestling capacity detection of microelectronic product to do the research.Keyword: microelectronic product; Drop; Test Machine; anti-wrestling; work theory目 录1 绪论................................................11．１ 跌落式试验机简介：...............................11．2 冲击试验的概念....................................11．3 冲击试验的方法概述................................21．...
