1 / 33 毕 业 设 计 （ 论 文 ） 中 文 摘 要基于 NDIR的塑料薄膜厚度测量技术研究摘要 ：随着塑料薄膜以与以薄膜为主要辅助材料的其他产品在工业生产和人类生活中的广泛应用，薄膜的厚度越来越成为一个重要的物理性指标。因此薄膜厚度的测量一直是人们密切关注和不断研究改进的课题。本论文主要容：第一，探讨了薄膜测厚技术的发展历史和研究现状；第二，详细介绍了基于NDIR的红外测原理以与系统的总体设计方案。第三，介绍了系统中使用的硬件设备，如数据采集卡、滤光传感器、光源和用到的两个焊接电路等；第四，阐述了所设计系统中的数据采集与处理过程和软件的运行流程与其主要的功能；最后，给出了系统调试运行的结果和数据的分析结果。本论文设计的系统可以模拟实际测厚系统的工作过程，并通过数据的分析对基于 NDIR的塑料薄膜厚度测量技术进行了研究与验证，达到了最初的设计要求。关键词：红外线测厚 VC++ NDIR 数据采集与处理2 / 33 毕 业 设 计 （ 论 文 ） 外 文 摘 要Title Study on the plastic film thickness measurement technology based on NDIRAbstract：With the wide application of plastic film and other products to the film as the main auxiliary materials in industrial production and the life of human beings, the thickness of the film is becoming a more and more important indicators of physical. So the film thickness measurement has been closely and continuously improve on the subject the people. The main contents of this paper: first, discusses the development history and research status of thin film thickness measurement technology; second, introduced in detail the overall design scheme of NDIR infrared measuring principle and system based on. Third, introduces the system used in the hardware, devices such as data acquisition card, filter sensor, light source and the use of two welding circuit; fourth, describes the operation process of the data acquisition and processing and software design and its main functions; finally, the system deb...
