1Table of Contents Chapter 1: System introduction...............................................................................................2 1.1 X-ray background.........................................................................................................2 1.2 X-ray instrument PANalytical X’pert...........................................................................3 1.3 User software................................................................................................................4 1.4 Auxiliary sample environments ..................................................................................8 Chapter 2: X-ray diffraction service and study.....................................................................1 0 2.1 Powder diffraction with X’Pert Accelerator .............................................................1 0 2.2 Calibrating instrument resolution.............................................................................1 1 2.3 Thin film/bulk and grazing angle scattering ............................................................1 6 2.3.1 Small angle scattering in Gonio mode of thin film or bulk ..........................1 8 2.3.2 Non-Gonio Grazing incidence scattering of thin film...................................1 9 Chapter 3: Residual stress measurement.............................................................................2 3 3.1 Basic principle............................................................................................................2 3 3.2 MRD characteristics and specimen alignment........................................................2 4 3.3 Study examples..........................................................................................................2 7 Chapter 4: XRD Quantitative Phase Analysis.......................................................................3 1 4...
