AEC_Q100最新版原文完整VIP专享VIP免费

AEC-Q100-Rev-HSePtemberlIq2014FAILUREMECHANISMBASEDSTRESSTESTQUALIFICATIONFORINTEGRATEDCIRCUITSAutomotiveElectronicsCouncil^—^≡-^^―ComponentTechnicalCommitteeAEC-QIOO-REV-HSePtember11,2014AutomotiveElectronicsCouncilComponentTechnicalCommitteeTABLEOFCONTENTSAEC-QlOOFailureMechanismBasedStressTestQualificationforIntegratedCircuitsAppendix1:DefinitionofaQualificationFamilyAppendix2:Q100CertificationofDesign,ConstructionandQualificationAppendix3:PlasticPackageOpeningforWireBondTestingAppendix4:MinimumRequirementsforQualificationPlansandResultsAppendix5:PartDesignCriteriatoDetermineNeedforEMCTestingAppendix6:PartDesignCriteriatoDetermineNeedforSERTestingAPPendiX7AEeQIOOandthnUSSOfMiSSiOoProfileSAttachmentsAEC-Q100-001:WIREBONDSHEARTESTAEC-Q100-002:HUMANBODYMODEL(HBM)ELECTROSTATICDISCHARGE(ESD)TESTAEC-Q100-003:MACHINEMODEL(MM)ELECTROSTATICDISCHARGE(ESD)TEST(DECOMMISSIONED)AEC-Q100-004:ICLATCH-UPTESTAEC-Q100-005:NONVOLATILEMEMORYWRITE/ERASEENDURANCE,DATARETENTION,ANDOPERATIONALLIFETESTAEC-Q100-006:ELECTRO-THERMALLYINDUCEDPARASITICGATELEAKAGE(GL)TEST(DECOMMISSIONED)AEC-Q100-007:FAULTSIMULATIONANDTESTGRADINGAEC-Q100-008:EARLYLIFEFAILURERATE(ELFR)AEC-Q100-009:ELECTRICALDISTRIBUTIONASSESSMENTAEC-Q100-010:SOLDERBALLSHEARTESTAEC-Q100-011:CHARGEDDEVICEMODEL(CDM)ELECTROSTATICDISCHARGE(ESD)TESTAEC-Q100-012:SHORTCIRCUITRELIABILITYCHARACTERIZATIONOFSMARTPOWERDEVICESFOR12VSYSTEMSRevisionSummaryThisinformativesectionbrieflydescribesthechangesmadeintheAEC-Q100Rev-Hdocument,comparedtopreviousdocumentversion,AEC-Q100Rev-G(May14,2007).Punctuationandtextimprovementsarenotincludedinthissummary.AEC-QIOO-REV-HSePtember11,2014AutomotiveElectronicsCouncil^^^^^^―ComponentTechnicalCommittee•Section1.2.1-AutomotiveReferenceDocuments:AddedreferencetoAEC-Q005Pb-FreeRequirements•NEWSection1.2.4-DecommissionedReferenceDocuments:AddednewsectionprovidingguidanceoneliminationofAEC-Q100-003MachineModelESD(removedduetoindustrytestobsolescence)andQ100-006ElectrothermallyInducedGateLeakage(removedduetolackofindustryneedasaqualificationtest)•Section1.3.1-AECQ100Qualification:AddedrecommendationthatpassingESDvoltagelevelbespecifiedinsupplierdatasheetwithfootnoteonanypinexceptions•NEWSection1.3.2-AECCertification:AddednewdefinitionclarifyingthatAEC-QlOo“ce巾fication”doesnotexist,suppliersperformqualificationtestingaccordingtoAECstandards•Section1.3.4一DefinitionofPartOperatingTemperatureGrade:AddednewTable1definingpartoperatingtemperaturegradesandguidanceonuseoftemperature(e.g.jendpoint,junction)duringtests;eliminatedGrade4(0℃to+70qC)entry•NEWSection1.3.5-CapabilityMeasure,Cpk:AddednewdefinitionandreferencetoAEC-Q003Characterizationdocument•Section2.2-PrecedenceofRequirements:AddedclarificationtoPurchaseOrderandDeviceSpecificationentries•Section2.3.1-DefinitionofGenericData:MovedexistingTable1,PartQualificationZRequaIificationLotRequirements,andportionofsectiontexttoAppendix1-DefinitionofaProductQualificationFamily•Section2.3.2-TimeLimitforAcceptanceofGenericData:AddedtextonuseofdiagraminFigure1•Section2.4.1-LotRequirements:AddedstatementthatdeviationfromTable2requirestechnicalexplanation•Section2.5-DefinitionofTestFailureAfterStressing:AddedstatementonEOS•Section3.1.1-QualificationofANewDeviceManufacturedinACurrentlyQualifiedFamily:Deletedthisentiresection,subjectiscoveredinAppendix1.•Section3....