1简易半导体三极管参数测试仪摘要:三极管特性参数测试系统以AT89S52单片机最小系统为核心,应用ADC0804和运放组成数据采集电路,DAC7528和精密电阻组成数控电压源
整个系统采用模块化设计,能较精确的对三极管交直流放大系数、集电极——发射极反向击穿电压和反向饱和电流等特性参数进行测量
利用单片机将采集所得的数据进行处理,并通过LCD对各项参数和输入输出曲线进行显示
关键词:单片机三极管采样特性参数系统测试Abstract:ThesystemisacharacteristicparameterstestsystemoftransistorbasedonAT89S52SCMsystemasthecorechip
WithAD0804andop-ampmakingupdataacquisitioncircuit,andwithDAC7528andpreciseresistancecomposingdigitalcontrolvoltagesource
Thewholesystemusesmodulardesign,itcanmeasurethecharacteristicsparametersoftransistor,likeac/dcamplificationcoefficientoftransistor,thecollectororemitterreversebreakdownvoltageandreversesaturationcurrent
TheacquireddataprocessedbySCMsystem,thenthevariousparameters,theinputandoutputcurvewilldisplayontheLCD
Keyword:SCMtransistorsamplecharacteristicparametertestsystem