精品文档---下载后可任意编辑GaN 基材料和器件辐照可靠性讨论的开题报告【摘要】本文针对 GaN 材料和器件辐照可靠性讨论，提出了以下讨论内容：首先，分析GaN 基材料和器件的辐照效应，探究辐照过程中的损伤机理，评估 GaN 器件辐照前后的电学和物理性能变化；其次，制备不同辐照剂量和能量的 GaN 材料和器件，通过辐照实验和性能测试，讨论 GaN 材料和器件在辐照过程中的可靠性；最后，对 GaN材料和器件的修复和改善方法进行讨论，探究提高 GaN 器件辐照可靠性的技术途径。【关键词】GaN，辐照，可靠性，损伤机理，修复【Abstract】This paper focuses on the study of GaN material and device radiation reliability. The following research contents are proposed: firstly, analyze the radiation effect of GaN-based materials and devices, explore the damage mechanism during radiation, and evaluate the changes in electrical and physical properties of GaN devices before and after radiation; Secondly, prepare GaN materials and devices with different radiation doses and energies, and study the reliability of GaN materials and devices during radiation through radiation experiments and performance testing; Finally, study the repair and improvement methods of GaN materials and devices, and explore the technical approaches to improve the radiation reliability of GaN devices.【Keywords】GaN, radiation, reliability, damage mechanism, repair
