第32卷第2期2009年4月电子器件ChineseJourna1OfElectronDevicesVo1.32No.2Apr.2009NovelFault-TolerantAdderDesignBasingontheTripleModuleRedundancySystemYINLi—qun.YUANGuo—SUn(InstituteofMicroelatronicso,fChineseAcademy0,Sciences,Beijing100029,China)Abstract:WeproposeTOIRSOwhichisforresolvingtheCMFsintheTMRsystems.ComparingtotheconventionalTMRsystem,theinvalidrateofsystemreduces47.Andafulladderprototypehasbeendeveloped.Thefault—tolerantabilityoftheadderusingthiskindofful1adderiSenhanced.Becauseonefaulr—mahinghasonlyaneffestontheresnerofonebitandnoinfluencetotheotherbits.Keywords:integratedcircuitdesign;triplemoduleredundancy(TMR);TOIRSO(ToleratingbyInvertedandRotateShiftedoperands);commonmodefailures(CMFs);fulladderEEACC:1265B一种基于FPGA的新颖的高容错加法器的设计*尹立群,袁国顺(中科院微电子研究所,北京100029)摘要:为了解决传统TMR结构的CMFs失效问题,根据加法器的结构特