智能机内测试研究综述张超1,2，马存宝1,2，宋东1，许家栋2 (1.西北工业大学航空学院陕西西安710072；2.西北工业大学电子信息学院陕西西安710072) 摘要：机内测试 (BIT) 是一种能显著提高系统测试性和诊断能力的重要技术，已大量应用于当代航空系统和武器装备中。但虚警问题是困扰BIT 应用的重大难题，并严重影响着武器装备的战备完好性和全寿命周期费用。因此，为从根本上解决BIT 的虚警问题，智能BIT 技术就成为测试领域21 世纪的重点研究项目之一。首先简要介绍了BIT 虚警的两个主要产生原因，然后重点概述了智能BIT 的发展状况，并分析了当前研究方法中存在的不足，最后在研究BIT 不确定性的基础上提出了基于粗糙集的智能BIT 故障诊断新技术，并指出了该技术中需要研究的若干关键问题。关键词： 智能机内测试；测试性；虚警；粗糙集；故障诊断中国分类号： TN56 文献标识码： A Intelligent Built-in Test: An Overview ZHANG Chao1,2, MA Cunbao1,2, Song Dong1, XU Jiadong2 (1. School of Aeronautics, Northwestern Polytechnical University, Xi’ an, Shaanxi, 710072;2. School of Electrical and Information, Northwestern Polytechnical University, Xi’ an, Shaanxi, 710072)Abstract: The Built-in Test (BIT) is an important technology that can greatly improve the testability and diagnosis capability of the system, and now it has been successfully applied in the aviation system and weapon equipment. However, the false alarm problem is one of the important factors that prevent BIT from being more extensively applied，and seriously affect the operational readiness and life cycle cost of weapon equipments. In order to reduce the high false alarm rate, intelligent BIT is a key test technique that should be well studied in the 21th century. Two main factors inducing BIT false alarm are firstly analyzed. Then, the achievements and development trends of intelligent BIT are reviewed in detail, and the shortcomings in today ’ s research are discussed. Finally, a new rough...
